Full Content is available to subscribers

Subscribe/Learn More  >
Proceedings Article

Evaluation of color error and noise on simulated images

[+] Author Affiliations
Clémence Mornet, Jérôme Vaillant, Thomas Decroux, Didier Hérault

STMicroelectronics (France)

Isabelle Schanen

IMEP-LAHC (France)

Proc. SPIE 7537, Digital Photography VI, 75370Y (January 18, 2010); doi:10.1117/12.853669
Text Size: A A A
From Conference Volume 7537

  • Digital Photography VI
  • Francisco Imai; Nitin Sampat; Feng Xiao
  • San Jose, California | January 17, 2010

abstract

The evaluation of CMOS sensors performance in terms of color accuracy and noise is a big challenge for camera phone manufacturers. On this paper, we present a tool developed with Matlab at STMicroelectronics which allows quality parameters to be evaluated on simulated images. These images are computed based on measured or predicted Quantum Efficiency (QE) curves and noise model. By setting the parameters of integration time and illumination, the tool optimizes the color correction matrix (CCM) and calculates the color error, color saturation and signal-to-noise ratio (SNR). After this color correction optimization step, a Graphics User Interface (GUI) has been designed to display a simulated image at a chosen illumination level, with all the characteristics of a real image taken by the sensor with the previous color correction. Simulated images can be a synthetic Macbeth ColorChecker, for which reflectance of each patch is known, or a multi-spectral image, described by the reflectance spectrum of each pixel or an image taken at high-light level. A validation of the results has been performed with ST under development sensors. Finally we present two applications one based on the trade-offs between color saturation and noise by optimizing the CCM and the other based on demosaicking SNR trade-offs.

© (2010) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Clémence Mornet ; Jérôme Vaillant ; Thomas Decroux ; Didier Hérault and Isabelle Schanen
"Evaluation of color error and noise on simulated images", Proc. SPIE 7537, Digital Photography VI, 75370Y (January 18, 2010); doi:10.1117/12.853669; http://dx.doi.org/10.1117/12.853669


Access This Proceeding
Sign in or Create a personal account to Buy this proceeding ($15 for members, $18 for non-members).

Figures

Tables

NOTE:
Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

Advertisement
  • Don't have an account?
  • Subscribe to the SPIE Digital Library
  • Create a FREE account to sign up for Digital Library content alerts and gain access to institutional subscriptions remotely.
Access This Proceeding
Sign in or Create a personal account to Buy this proceeding ($15 for members, $18 for non-members).
Access This Proceeding
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
Access This Chapter

Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.