Analysis of electrical tomography sensitive field based on multi-terminal network and electric field

Yongbo He; Xingguo Su; Meng Xu; Huaxiang Wang

doi:10.1117/12.885608

28 December 2010 Analysis of electrical tomography sensitive field based on multi-terminal network and electric field

Yongbo He, Xingguo Su, Meng Xu, Huaxiang Wang

Proceedings Volume 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation; 75441Y (2010) https://doi.org/10.1117/12.885608
Event: Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 2010, Hangzhou, China

Abstract

Electrical tomography (ET) aims at the study of the conductivity/permittivity distribution of the interested field non-intrusively via the boundary voltage/current. The sensor is usually regarded as an electric field, and finite element method (FEM) is commonly used to calculate the sensitivity matrix and to optimize the sensor architecture. However, only the lumped circuit parameters can be measured by the data acquisition electronics, it's very meaningful to treat the sensor as a multi terminal network. Two types of multi terminal network with common node and common loop topologies are introduced. Getting more independent measurements and making more uniform current distribution are the two main ways to minimize the inherent ill-posed effect. By exploring the relationships of network matrixes, a general formula is proposed for the first time to calculate the number of the independent measurements. Additionally, the sensitivity distribution is analyzed with FEM. As a result, quasi opposite mode, an optimal single source excitation mode, that has the advantages of more uniform sensitivity distribution and more independent measurements, is proposed.

Citation Download Citation

Yongbo He, Xingguo Su, Meng Xu, and Huaxiang Wang "Analysis of electrical tomography sensitive field based on multi-terminal network and electric field", Proc. SPIE 7544, Sixth International Symposium on Precision Engineering Measurements and Instrumentation, 75441Y (28 December 2010); https://doi.org/10.1117/12.885608

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KEYWORDS

Sensors

Electrodes

Tomography

Finite element methods

Data acquisition

Electric field sensors

Electronics

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