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Proceedings Article

Fiber optics low-coherence IR interferometry for defense sensors manufacturing

[+] Author Affiliations
Wojtek J. Walecki, Fanny Szondy

Sunrise Optical LLC (USA)

Proc. SPIE 7322, Photonic Microdevices/Microstructures for Sensing, 73220K (April 30, 2009); doi:10.1117/12.818381
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From Conference Volume 7322

  • Photonic Microdevices/Microstructures for Sensing
  • Hai Xiao; Xudong Fan; Anbo Wang
  • Orlando, Florida, USA | April 13, 2009
Abstract

abstract

We present novel fiber optics low coherence interferometer apparatus, and novel probe for in-situ characterization of semiconductor structures for IR detector manufacturing. Probe does not exhibit polarization, or strain sensitivity observed in earlier invented systems. In addition it is demonstrated to be able to operate with varying length of optical fibers.

© (2009) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Wojtek J. Walecki and Fanny Szondy
"Fiber optics low-coherence IR interferometry for defense sensors manufacturing", Proc. SPIE 7322, Photonic Microdevices/Microstructures for Sensing, 73220K (April 30, 2009); doi:10.1117/12.818381; http://dx.doi.org/10.1117/12.818381


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