Programmable array microscopes (PAMs) use "multi-pinhole" masks in confocal image planes to introduce illumination and block the "out-of-focus light". Compared to traditional confocal microscopes (CM), PAM systems have higher efficiency in utilizing the signal light and faster image acquisition speed. However, these advantages are gained at the cost of using more complicated optics and detectors. Compressive sampling (CS) measurement patterns can be used as pinhole masks in PAM systems. With CS patterns, the light collected after the detector mask can be summed up and used to reconstruct the imaging scene via solving an l 1-minimization problem. Only a simple relay-lens and a singlepixel detector are needed to measure the intensity of the summed light. Therefore the optical complexity associated with conventional PAM systems can be reduced. Since only a single-pixel detector is needed, this system can also be called a single-pixel PAM or SP-PAM system. In this work, we introduce the design and fabrication of a prototype SP-PAM system. In this system, scrambled-block Hadamard ensembles (SBHE) are used as CS measurement patterns and a digital micromirror device (DMD) is employed to realize these patterns.© (2010) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.