Paper
13 September 2010 Method of measure of roughness of paper based in the analysis of the texture of speckle pattern
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Proceedings Volume 7387, Speckle 2010: Optical Metrology; 73871W (2010) https://doi.org/10.1117/12.869655
Event: Speckle 2010, 2010, Florianapolis, Brazil
Abstract
Roughness of paper surface is an important parameter in paper manufacturing. Surface roughness measurement is one of the central measurement problems in paper industry. Surfaces are often coated and the amount of coating and method of application used depends on the roughness of the base paper [1], [2]. At the moment, air leak methods are standardized and employed in paper industry as roughness rating methods. Air leak rate between measured paper surface and a specified flat land is recorded by using specialized pneumatic devices under laboratory conditions. Such a measurement closely corresponds to the roughness of a surface, the greater the air leak the rougher the surface. Air leak methods are rather easy to apply to paper and give stable results, although they measure roughness indirectly, need laboratory conditions, and thus unsuitable for on-line use. To measure real topography of paper surface, it is scanned with mechanical or optical profilometers. These methods provide accurate information on surface topography, but also demand laboratory conditions. In our work, present a method of measure based in the analysis of the texture of speckle pattern on the surface. The image formed by speckle in the paper surface is considered as a texture, and therefore texture analysis methods are suitable for the characterization of paper surface. The results are contrasted to air leak methods, optical profilometers (confocal microscopy), and fringe projection.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. O. Pino, J. Pladellorens, and J. F. Colom "Method of measure of roughness of paper based in the analysis of the texture of speckle pattern", Proc. SPIE 7387, Speckle 2010: Optical Metrology, 73871W (13 September 2010); https://doi.org/10.1117/12.869655
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Cited by 8 scholarly publications.
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KEYWORDS
Surface roughness

Speckle pattern

Radium

Confocal microscopy

Speckle

Algorithm development

Image analysis

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