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Proceedings Article

Multifocus microscope image fusion analysis based on Daubechies wavelets

[+] Author Affiliations
Alfonso Padilla-Vivanco, C. Santiago-Tepantlan

Univ. Politécnica de Tulancingo (Mexico)

Carina Toxqui-Quitl

Univ. Politécnica de Tulancingo (Mexico) and Instituto Nacional de Astrofísica, Óptica y Electrónica (Mexico)

Proc. SPIE 7389, Optical Measurement Systems for Industrial Inspection VI, 73893G (June 15, 2009); doi:10.1117/12.828484
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From Conference Volume 7389

  • Optical Measurement Systems for Industrial Inspection VI
  • Peter H. Lehmann
  • Munich, Germany | June 15, 2009

abstract

We present in this work a multifocus image fusion algorithm based on wavelet transforms applied to multifocus microscopy images acquired by the bright-field technique. The fusion scheme is based on the Daubechies family transforms. Experimental results are presented using metallic samples.

© (2009) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Alfonso Padilla-Vivanco ; Carina Toxqui-Quitl and C. Santiago-Tepantlan
"Multifocus microscope image fusion analysis based on Daubechies wavelets", Proc. SPIE 7389, Optical Measurement Systems for Industrial Inspection VI, 73893G (June 15, 2009); doi:10.1117/12.828484; http://dx.doi.org/10.1117/12.828484


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