Paper
17 June 2009 Talbot effect with aberrated beams
Author Affiliations +
Abstract
Diffraction gratings are one of the most used elements in optics and even in other fields of science. They are used also like part of measurement devices in scientific and industrial applications. As it is well known, self-imaging effect appears when a diffraction grating is illuminated with a coherent beam, such as a plane wave. This effect has been analyzed in depth and its behavior is well known under ideal grating and illumination conditions. Usually, the illumination beam is not perfectly collimated but presents a certain degree of aberration. The motivation of this work is to try to explain the behavior of the self-images of an ideal amplitude grating when it is illuminated by a non-perfect beam, that is, an aberrated beam. The known of this effect can help to understand how much the aberration of the light beam affects to the diffraction pattern, and more in depth, to the self-imaging phenomenon. The results presented in this work can be very useful in metrology applications, since sometimes the contrast obtained experimentally does not correspond to the theoretical predictions, usually due to aberrations in the light beam. For this, we have used a formalism based in the Rayleigh-Sommerfeld approach. We have modeled the aberrations by using the Zernike polynomials. On the other hand, we have considered all kinds of aberrations, spherical, coma, tilt, astigmatism, etc. As it is expected the contrast of the self-images decrease when the order of them increases and also when the aberration degree increase. In some cases, contrast inversion is also produced for high aberrations.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Francisco José Torcal-Milla, Luis Miguel Sanchez-Brea, and Eusebio Bernabeu "Talbot effect with aberrated beams", Proc. SPIE 7390, Modeling Aspects in Optical Metrology II, 739013 (17 June 2009); https://doi.org/10.1117/12.827539
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Monochromatic aberrations

Diffraction gratings

Diffraction

Zernike polynomials

Spherical lenses

Modulation

Metrology

RELATED CONTENT

Talbot imaging with magnification
Proceedings of SPIE (September 30 1994)
MOSAIC: a new wavefront metrology
Proceedings of SPIE (March 23 2009)
Design of a discrete scan laser focusing system with a...
Proceedings of SPIE (August 29 2008)

Back to Top