Paper
7 July 2009 Fourier domain optical coherence tomography for high-precision profilometry
Author Affiliations +
Abstract
A Fourier domain (FD) optical coherence tomography (OCT) system is shown to be capable of profilometry with two orders of magnitude better accuracy than the axial imaging resolution of the system. High precision OCT profilometry not only achieves similar accuracy as commercial white light interferometry based profilometers but is also capable of profilometry on complex subsurface structures with multiple interfaces of low reflectance. An accuracy of 55nm was achieved with a ThorLabs SROCT on a lab bench without special anti-vibration devices. This technique has the potential for a range of applications, such as high precision refractive index measurements and simultaneous dynamic monitoring of the interface structure of a drying varnish and the substrate.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Samuel Lawman and Haida Liang "Fourier domain optical coherence tomography for high-precision profilometry", Proc. SPIE 7391, O3A: Optics for Arts, Architecture, and Archaeology II, 73910H (7 July 2009); https://doi.org/10.1117/12.827518
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Optical coherence tomography

Interfaces

Refractive index

Speckle

Point spread functions

Surface roughness

Error analysis

RELATED CONTENT

About Speckle
Proceedings of SPIE (November 25 1985)

Back to Top