Loss monitoring in resonant photon tunneling through metal and dielectric multi-layer metamaterials

Motonobu Matsunaga; Satoshi Tomita; Takashi Yokoyama; Hisao Yanagi

doi:10.1117/12.825828

2 September 2009 Loss monitoring in resonant photon tunneling through metal and dielectric multi-layer metamaterials

Motonobu Matsunaga, Satoshi Tomita, Takashi Yokoyama, Hisao Yanagi

Proceedings Volume 7395, Plasmonics: Nanoimaging, Nanofabrication, and their Applications V; 73951J (2009) https://doi.org/10.1117/12.825828
Event: SPIE NanoScience + Engineering, 2009, San Diego, California, United States

Abstract

Loss is a critical parameter in metamaterials because it determines the resolution of a super-lens made of metamaterials. The super-lensing effect observed in alternative multi-layer metamaterials consisting of metal and dielectric layers is derived from the resonant photon tunneling (RPT) via surface plasmon polaritons (SPPs). Here we demonstrates that the losses in the metamaterials can be estimated by simultaneous measurements of attenuated total reflection (ATR) and RPT. RPT through silver (Ag)/SiO₂ metamaterials is studied experimentally. A shift of the RPT peak away from the ATR dip is observed; the shift variation in an Ag/SiO₂ system is smaller than that in an aluminum/MgF₂ system. This indicates that the shift is caused by the imaginary part of permittivity, i.e., intrinsic losses, of metamaterials.

Citation Download Citation

Motonobu Matsunaga, Satoshi Tomita, Takashi Yokoyama, and Hisao Yanagi "Loss monitoring in resonant photon tunneling through metal and dielectric multi-layer metamaterials", Proc. SPIE 7395, Plasmonics: Nanoimaging, Nanofabrication, and their Applications V, 73951J (2 September 2009); https://doi.org/10.1117/12.825828

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