Accelerated testing of metal foil tape joints and their effect of photovoltaic module reliability

N. Robert Sorensen; Michael A. Quintana; Joseph D. Puskar; Samuel J. Lucero

doi:10.1117/12.826876

20 August 2009 Accelerated testing of metal foil tape joints and their effect of photovoltaic module reliability

N. Robert Sorensen, Michael A. Quintana, Joseph D. Puskar, Samuel J. Lucero

Proceedings Volume 7412, Reliability of Photovoltaic Cells, Modules, Components, and Systems II; 74120R (2009) https://doi.org/10.1117/12.826876
Event: SPIE Solar Energy + Technology, 2009, San Diego, California, United States

Abstract

A program is underway at Sandia National Laboratories to predict long-term reliability of photovoltaic (PV) systems. The vehicle for the reliability predictions is a Reliability Block Diagram (RBD), which models system behavior. Because this model is based mainly on field failure and repair times, it can be used to predict current reliability, but it cannot currently be used to accurately predict lifetime. In order to be truly predictive, physics-informed degradation processes and failure mechanisms need to be included in the model. This paper describes accelerated life testing of metal foil tapes used in thin-film PV modules, and how tape joint degradation, a possible failure mode, can be incorporated into the model.

Citation Download Citation

N. Robert Sorensen, Michael A. Quintana, Joseph D. Puskar, and Samuel J. Lucero "Accelerated testing of metal foil tape joints and their effect of photovoltaic module reliability", Proc. SPIE 7412, Reliability of Photovoltaic Cells, Modules, Components, and Systems II, 74120R (20 August 2009); https://doi.org/10.1117/12.826876

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