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Proceedings Article

Generic materials property data storage and retrieval for the semiconducting materials knowledge base

[+] Author Affiliations
Dumont M. Jones, Joan T. Muellerleile

Proximate Technologies, LLC (USA)

Kim F. Ferris, Bobbie-Jo M. Webb-Robertson

Pacific Northwest National Lab. (USA)

Roger W. Hyatt

Battelle Memorial Institute (USA)

Proc. SPIE 7449, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI, 74491R (September 11, 2009); doi:10.1117/12.830146
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From Conference Volume 7449

  • Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI
  • Ralph B. James; Larry A. Franks; Arnold Burger
  • San Diego, CA | August 02, 2009

abstract

Informatics-based identification of candidate semiconducting radiation detection materials depends upon the development of a robust knowledge base of materials properties. However, the accuracy and integrity of the knowledge base are often affected by information loss due to incomplete entry and loss of context. We describe our methods for materials property data storage and retrieval, in support of semiconductor development for gamma radiation detection materials informatics applications. Analysis-ready data representations vary with each materials design problem, and are often inconsistent with accurate generic property storage. The proposed approach provides simple, strongly-typed generic storage for as-measured properties, with tools for assessing as-measured properties and converting them to analysis-ready representations. This process simplifies property data stewardship, and allows fine control over the assumptions of data fusion, system characterization, and property representation employed in property-estimation models.

© (2009) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Dumont M. Jones ; Kim F. Ferris ; Bobbie-Jo M. Webb-Robertson ; Joan T. Muellerleile and Roger W. Hyatt
"Generic materials property data storage and retrieval for the semiconducting materials knowledge base", Proc. SPIE 7449, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI, 74491R (September 11, 2009); doi:10.1117/12.830146; http://dx.doi.org/10.1117/12.830146


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