Informatics-based identification of candidate semiconducting radiation detection materials depends upon the development of a robust knowledge base of materials properties. However, the accuracy and integrity of the knowledge base are often affected by information loss due to incomplete entry and loss of context. We describe our methods for materials property data storage and retrieval, in support of semiconductor development for gamma radiation detection materials informatics applications. Analysis-ready data representations vary with each materials design problem, and are often inconsistent with accurate generic property storage. The proposed approach provides simple, strongly-typed generic storage for as-measured properties, with tools for assessing as-measured properties and converting them to analysis-ready representations. This process simplifies property data stewardship, and allows fine control over the assumptions of data fusion, system characterization, and property representation employed in property-estimation models.© (2009) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.