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Proceedings Article

High-resolution optical modeling of the Thirty Meter Telescope for systematic performance trades

[+] Author Affiliations
Carl Nissly, Byoung-Joon Seo, Mitchell Troy, John Angione, Norbert Sigrist

Jet Propulsion Lab. (USA) and California Institute of Technology (USA)

George Angeli, Brent Ellerbroek, Luc Gilles

Thirty Meter Telescope Observatory (USA) and California Institute of Technology (USA)

Ian Crossfield

Univ. of California, Los Angeles (USA)

Proc. SPIE 7017, Modeling, Systems Engineering, and Project Management for Astronomy III, 70170U (July 09, 2008); doi:10.1117/12.788596
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From Conference Volume 7017

  • Modeling, Systems Engineering, and Project Management for Astronomy III
  • George Z. Angeli; Martin J. Cullum
  • Marseille, France | June 23, 2008

abstract

We consider high-resolution optical modeling of the Thirty Meter Telescope for the purpose of error budget and instrumentation trades utilizing the Modeling and Analysis for Controlled Optical Systems tool. Using this ray-trace and diffraction model we have simulated the TMT optical errors related to multiple effects including segment alignment and phasing, segment surface figures, temperature, and gravity. We have then modeled the effects of each TMT optical error in terms of the Point Source Sensitivity (a multiplicative image plane metric) for a seeing limited case and an adaptive optics corrected case (for the NFIRAOS). This modeling provides the information necessary to rapidly conduct design trades with respect to the planned telescope instrumentation and to optimize the telescope error budget.

© (2008) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Carl Nissly ; Byoung-Joon Seo ; Mitchell Troy ; George Angeli ; John Angione, et al.
"High-resolution optical modeling of the Thirty Meter Telescope for systematic performance trades", Proc. SPIE 7017, Modeling, Systems Engineering, and Project Management for Astronomy III, 70170U (July 09, 2008); doi:10.1117/12.788596; http://dx.doi.org/10.1117/12.788596


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