Paper
30 October 2009 Orbit inaccuracy influence in InSAR products
Min He, Xiufeng He
Author Affiliations +
Proceedings Volume 7494, MIPPR 2009: Multispectral Image Acquisition and Processing; 74940S (2009) https://doi.org/10.1117/12.832604
Event: Sixth International Symposium on Multispectral Image Processing and Pattern Recognition, 2009, Yichang, China
Abstract
Satellite orbital state vectors are required not only to determine the baseline parameters, the coarse offset in registration step but also to remove the phase of the flat Earth and geocode the InSAR products to WGS84. The quality of orbit plays an important role in InSAR products, i.e. DEMs and deformation maps. The orbit inaccuracy in along-track, radial and across-track directions is transformed into a noise baseline vector. Baseline errors are introduced into the InSAR products in the Flat-Earth phase subtraction and topographic phase subtraction processing steps. Under the transformation, the influences of the orbit inaccuracy in the two InSAR processing steps and the InSAR products are analyzed. According to the error propagation theory, we built the relationship between orbit errors and InSAR products. The influence of orbit errors caused by imprecise topography subtraction is small in comparison to imprecisely subtracted flat-Earth phase. The propagation of orbit errors to deformation maps is derived, revealing that the influence of orbital error on deformation is much lower than that on height and only sub-millimeters.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Min He and Xiufeng He "Orbit inaccuracy influence in InSAR products", Proc. SPIE 7494, MIPPR 2009: Multispectral Image Acquisition and Processing, 74940S (30 October 2009); https://doi.org/10.1117/12.832604
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Interferometric synthetic aperture radar

Satellites

Error analysis

Interferometry

Synthetic aperture radar

Associative arrays

Distance measurement

Back to Top