Paper
22 July 2008 Pixel area variation in CCDs and implications for precision photometry
Author Affiliations +
Abstract
Images with smooth and moderately flat illumination are commonly used to calibrate pixel to pixel sensitivity variation without consideration that some structure on short spatial scales may be due to reallocation of area between pixels. Errors in the position of pixel boundaries have the effect of repartitioning charge between pixels but do not affect the total charge collected. Since the resulting errors tend to cancel when combining signal from adjacent pixels, this effect has gone largely unnoticed. However proposed wide field astronomical surveys, which strive to achieve high photometric precision with coarse spatial sampling, must take this into account. We present simple analysis techniques to identify how much flat field structure is due to systematic and random variations in pixel area, rather than sensitivity, as a function of row/column direction and spatial frequency. Analysis of data from CCDs made with radically different technologies and pixel sizes by different manufacturers suggests that pixel size variation in the column direction probably dominates QE variations on short spatial scales for all CCDs. Refinements to flat field calibration methods and tests to confirm their efficacy are proposed.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Roger M. Smith and Gustavo Rahmer "Pixel area variation in CCDs and implications for precision photometry", Proc. SPIE 7021, High Energy, Optical, and Infrared Detectors for Astronomy III, 70212A (22 July 2008); https://doi.org/10.1117/12.789665
Lens.org Logo
CITATIONS
Cited by 25 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Charge-coupled devices

Quantum efficiency

Photomasks

Photometry

Spatial frequencies

Calibration

Clocks

RELATED CONTENT

Silux: a unit of silicon detector-weighted irradiance
Proceedings of SPIE (June 14 2023)
Exploring s-CIELAB as a scanner metric for print uniformity
Proceedings of SPIE (January 17 2005)
Astrometric calibration of array detectors
Proceedings of SPIE (June 01 1994)
SPIRE: a bolometer instrument for FIRST
Proceedings of SPIE (July 31 1998)

Back to Top