PV reliability determination from I-V measurement and analysis

K. Emery

doi:10.1117/12.795965

28 August 2008 PV reliability determination from I-V measurement and analysis

K. Emery

Proceedings Volume 7048, Reliability of Photovoltaic Cells, Modules, Components, and Systems; 704803 (2008) https://doi.org/10.1117/12.795965
Event: Solar Energy + Applications, 2008, San Diego, California, United States

Abstract

We discuss the measurement and analysis of current vs. voltage (I-V) characteristics of photovoltaic (PV) cells and modules for reliability determination. We discuss both the error sources in the measurements and the strategies to minimize their influence. These error sources include the sample area, spectral errors, temperature fluctuations, current and voltage response time, contacting, and degradation during testing issues. Information that can be extracted from light and dark I-V includes peak power, open-circuit voltage, short-circuit current, series and shunt resistance, diode quality factor, dark current, and photo-current. The quantum efficiency provides information on photo-current nonlinearities, current generation and recombination mechanisms.

Citation Download Citation

K. Emery "PV reliability determination from I-V measurement and analysis", Proc. SPIE 7048, Reliability of Photovoltaic Cells, Modules, Components, and Systems, 704803 (28 August 2008); https://doi.org/10.1117/12.795965

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