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Proceedings Article

Integrated quantum efficiency, topography, and stress metrology for solar cell manufacturing: real space approach

[+] Author Affiliations
Wojtek J. Walecki, Fanny Szondy

Sunrise Optical LLC (USA)

Proc. SPIE 7048, Reliability of Photovoltaic Cells, Modules, Components, and Systems, 704804 (September 10, 2008); doi:10.1117/12.792934
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From Conference Volume 7048

  • Reliability of Photovoltaic Cells, Modules, Components, and Systems
  • Neelkanth G. Dhere
  • San Diego, CA | August 10, 2008

abstract

We report a new system for measurement of the spatially resolved quantum efficiency (QE) of the semiconductor solarcells. In our method solar-cell is illuminated by modified liquid crystal display projector scanner. System allows to measure photo-current, and optical properties of the illuminated surface. The same system can be also used to measure surface topography of the wafer, its bow, and warp, and calculate lateral stress in the structure if structure cross-section is known.

© (2008) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Wojtek J. Walecki and Fanny Szondy
"Integrated quantum efficiency, topography, and stress metrology for solar cell manufacturing: real space approach", Proc. SPIE 7048, Reliability of Photovoltaic Cells, Modules, Components, and Systems, 704804 (September 10, 2008); doi:10.1117/12.792934; http://dx.doi.org/10.1117/12.792934


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