Random microstructure generation of different aspect-ratios and orientation for the optical design of LED edge-lit backlight using a generalized molecular dynamics force model

Jee-Gong Chang; Chuan Chen; Yu-Bin Fang; Shin-Pon Ju

doi:10.1117/12.800609

2 September 2008 Random microstructure generation of different aspect-ratios and orientation for the optical design of LED edge-lit backlight using a generalized molecular dynamics force model

Jee-Gong Chang, Chuan Chen, Yu-Bin Fang, Shin-Pon Ju

Author Affiliations +

Proceedings Volume 7059, Nonimaging Optics and Efficient Illumination Systems V; 70590T (2008) https://doi.org/10.1117/12.800609
Event: Optical Engineering + Applications, 2008, San Diego, California, United States

Abstract

This study proposes a generation scheme for the light guide of the edge-lit backlight using a microstructure with a pattern combining variable aspect ratio and a variable microstructure orientation, based on the molecular dynamics method of a generalized force model. This generation scheme is necessary to accommodate the need for the subsequent optical design phase, and allows for easier optical optimization for the microstructure distribution in order to reach the equal luminance condition. These needs are met by the cell division, which allows the adjustment of the microstructure density in each sub-domain, or cell. The boundary treatments allow the precise control of the microstructure density in each cell and the ability to smooth the microstructure distribution across the cell boundary. Finally, the performance of this generation scheme, as well as a practical example combining this scheme with the optical design, is shown and discussed.

Citation Download Citation

Jee-Gong Chang, Chuan Chen, Yu-Bin Fang, and Shin-Pon Ju "Random microstructure generation of different aspect-ratios and orientation for the optical design of LED edge-lit backlight using a generalized molecular dynamics force model", Proc. SPIE 7059, Nonimaging Optics and Efficient Illumination Systems V, 70590T (2 September 2008); https://doi.org/10.1117/12.800609

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