Paper
2 September 2008 Cross-grating slit test with an interlacing tip-tilt alignment method
Chao-Wen Liang, Chien-Fu Ou
Author Affiliations +
Abstract
The phase-shifting Grating-Slit test has advantages of large measurement dynamic range when using with spatial light modulator (SLM) to generate the illuminating. But the rotary slit in the test does reduce the measuring speed and may cause measurement error if it's not aligned properly with the grating. Thus, a new modulating apparatus is proposed to replace the rotary slit used in the Grating-Slit test. In addition, a pellicle beam splitter is used to make the on-axis measurement possible and the measurement error from misalignment is greatly reduced. With a micro liquid crystal display generating and switching the direction of the illuminating grating, we can simultaneously interlace the tip-tilt direction alignments during measurement.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chao-Wen Liang and Chien-Fu Ou "Cross-grating slit test with an interlacing tip-tilt alignment method", Proc. SPIE 7068, Optical System Alignment and Tolerancing II, 70680I (2 September 2008); https://doi.org/10.1117/12.795083
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Cited by 1 scholarly publication.
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KEYWORDS
Modulation

Ronchi rulings

LCDs

Mirrors

Optical testing

Phase shifting

Wavefronts

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