Paper
17 June 2008 Whole field out-of-plane vibration analysis with a HOE-based ESPI system
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Proceedings Volume 7098, Eighth International Conference on Vibration Measurements by Laser Techniques: Advances and Applications; 70980M (2008) https://doi.org/10.1117/12.803004
Event: Eighth International Conference on Vibration Measurements by Laser Techniques: Advances and Applications, 2008, Ancona, Italy
Abstract
Electronic speckle pattern interferometry (ESPI) is a full-field measurement technique, capable of displaying vibrational mode shapes. A simple optical set-up for an ESPI system using a holographic optical element (HOE) is presented. The HOE is designed to create a speckled reference beam in the interferometer. A partially reflective glass plate provides illumination of the object along the normal to its surface, ensuring that the system is sensitive only to out-of-plane displacement of the object. It is demonstrated that the HOE-based system can be used for vibration measurements. Phase shifting can be implemented for fringe analysis. A big advantage of the system is its simplicity. It requires a small number of components: a coherent light source, a holographic optical element, a glass plate and a CCD camera. Introducing holographic optical elements in ESPI gives the advantage of large aperture optical elements at relatively low cost.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Emilia Mihaylova, Viswanath Bavigadda, Raghavendra Jallapuram, and Vincent Toal "Whole field out-of-plane vibration analysis with a HOE-based ESPI system", Proc. SPIE 7098, Eighth International Conference on Vibration Measurements by Laser Techniques: Advances and Applications, 70980M (17 June 2008); https://doi.org/10.1117/12.803004
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Cited by 2 scholarly publications.
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KEYWORDS
Holographic optical elements

Glasses

Speckle pattern

Vibrometry

Reflectivity

Interferometers

Interferometry

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