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Proceedings Article

Intraocular lens characterization using a quadric-wave lateral shearing interferometer wave front sensor

[+] Author Affiliations
W. Boucher, S. Velghe, B. Wattellier

PHASICS S.A. (France)

D. Gatinel

Rothschild Foundation, CEROC (France)

Proc. SPIE 7102, Optical Fabrication, Testing, and Metrology III, 71020Q (September 25, 2008); doi:10.1117/12.797682
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From Conference Volume 7102

  • Optical Fabrication, Testing, and Metrology III
  • Angela Duparré; Roland Geyl
  • Glasgow, Scotland, United Kingdom | September 01, 2008

abstract

We present the application of Quadri-Wave Lateral Shearing Interferometry (QWLSI), a wave front sensing technique, to characterize synthetic intraocular lens (IOL). Wave front sensing is not only a tool to quantify optical quality, but also to map the local (dust, scratches) or global possible defects. This method offers the crucial advantage that it yields an analyzed wave front without the use of a reference arm and consequent time consuming alignment. Moreover thanks to the acceptance of QWLSI to high numerical aperture beams, no additional optics is required. This makes lens characterization convenient and very fast. We will first explain the QWLSI design and metrological properties (high resolution and dynamic) and its analysis features (aberration measurement, MTF evaluation). We will present our device KALEO for characterization of IOLs. We will particularly show aberrations and MTF measurements of monofocal spherical IOLs. We will present how the QWLSI can answer to the specific analysis of aspherical IOLs. We will finally show a complete characterization of multifocal IOLs in one measurement helping the propagation theory.

© (2008) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

W. Boucher ; S. Velghe ; B. Wattellier and D. Gatinel
"Intraocular lens characterization using a quadric-wave lateral shearing interferometer wave front sensor", Proc. SPIE 7102, Optical Fabrication, Testing, and Metrology III, 71020Q (September 25, 2008); doi:10.1117/12.797682; http://dx.doi.org/10.1117/12.797682


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