Paper
12 January 2009 Near-field birefringence response of IPS liquid crystal thin film detected by Bi-SNOM
Author Affiliations +
Proceedings Volume 7133, Fifth International Symposium on Instrumentation Science and Technology; 71333D (2009) https://doi.org/10.1117/12.807778
Event: International Symposium on Instrumentation Science and Technology, 2008, Shenyang, China
Abstract
Dynamics information of nematic liquid crystal (NLC) in In-Plane-Switching (IPS) mode is attractive and important for applications of high vision angle techniques. In this paper, we used a novel evaluation method to detect the molecular orientation dynamics of NLC thin film in depth direction from its birefringence responses using birefringence scanning near-field optical microscopy (Bi-SNOM). In this method, a Bi-SNOM probe is inserted into IPS mode NLC thin film, in which the time responses of LC molecules at different position in depth are also measured. In addition, Molecular orientation hysteresis to the applied voltage is observed. We measured the orientation hysteresis of LC molecules at different position along the depth direction in the LC thin film. Experimental results show that the proposed method is effective and feasible for its consistence with original specialities.
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Jing Qin and Norihiro Umeda "Near-field birefringence response of IPS liquid crystal thin film detected by Bi-SNOM", Proc. SPIE 7133, Fifth International Symposium on Instrumentation Science and Technology, 71333D (12 January 2009); https://doi.org/10.1117/12.807778
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