Paper
3 October 2008 Frequency-shifting method for phase retrieval from fringe patterns
Haixia Wang, Kemao Qian, Wenjing Gao
Author Affiliations +
Proceedings Volume 7155, Ninth International Symposium on Laser Metrology; 71550N (2008) https://doi.org/10.1117/12.814522
Event: Ninth International Symposium on Laser Metrology, 2008, Singapore, Singapore
Abstract
A novel frequency-shifting method for phase retrieval from fringe patterns is proposed. It needs two fringe patterns. In the second fringe pattern, a low frequency carrier is introduced. The low carrier frequency is used to open only fringe patches near critical points rather than the whole fringe pattern. The windowed Fourier ridges algorithm is used to retrieve the phase, which is able to characterize the density of the fringe patterns so that critical points can be recognized. The method is verified by a simulation example.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Haixia Wang, Kemao Qian, and Wenjing Gao "Frequency-shifting method for phase retrieval from fringe patterns", Proc. SPIE 7155, Ninth International Symposium on Laser Metrology, 71550N (3 October 2008); https://doi.org/10.1117/12.814522
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KEYWORDS
Fringe analysis

Phase retrieval

Phase shifts

Demodulation

Detection and tracking algorithms

Fourier transforms

Mirrors

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