Fast differential luminescence thermometry

Denis V. Seletskiy; Michael P. Hasselbeck; Mansoor Sheik-Bahae; Richard I. Epstein

doi:10.1117/12.810856

9 February 2009 Fast differential luminescence thermometry

Denis V. Seletskiy, Michael P. Hasselbeck, Mansoor Sheik-Bahae, Richard I. Epstein

Proceedings Volume 7228, Laser Refrigeration of Solids II; 72280K (2009) https://doi.org/10.1117/12.810856
Event: SPIE OPTO: Integrated Optoelectronic Devices, 2009, San Jose, California, United States

Abstract

Differential luminescence thermometry (DLT) allows non-contact method of measuring temperature by timedifferencing luminescence spectra emitted from the material in study. Here, we present a modification to the DLT technique, termed "two-pixel DLT" (2pixDLT), that combines high temperature and temporal resolutions at the expense of reduced spectral sampling of the luminescence signal. We showcase our technique by demonstrating millisecond/millidegree resolution in time and temperature in heating dynamics of GaAs heterostructure sample. We utilize tnis technique to determine minimum achievable temperature in rare-earth doped fluoride crystal Yb:YLF to be 170K, when excited at 1030nm.

Citation Download Citation

Denis V. Seletskiy, Michael P. Hasselbeck, Mansoor Sheik-Bahae, and Richard I. Epstein "Fast differential luminescence thermometry", Proc. SPIE 7228, Laser Refrigeration of Solids II, 72280K (9 February 2009); https://doi.org/10.1117/12.810856

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