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Proceedings Article

Fast differential luminescence thermometry

[+] Author Affiliations
Denis V. Seletskiy, Michael P. Hasselbeck, Mansoor Sheik-Bahae

The Univ. of New Mexico (USA)

Richard I. Epstein

The Univ. of New Mexico (USA) and Los Alamos National Lab. (USA)

Proc. SPIE 7228, Laser Refrigeration of Solids II, 72280K (February 09, 2009); doi:10.1117/12.810856
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From Conference Volume 7228

  • Laser Refrigeration of Solids II
  • Richard I. Epstein; Mansoor Sheik-Bahae
  • San Jose, CA | January 24, 2009

abstract

Differential luminescence thermometry (DLT) allows non-contact method of measuring temperature by timedifferencing luminescence spectra emitted from the material in study. Here, we present a modification to the DLT technique, termed "two-pixel DLT" (2pixDLT), that combines high temperature and temporal resolutions at the expense of reduced spectral sampling of the luminescence signal. We showcase our technique by demonstrating millisecond/millidegree resolution in time and temperature in heating dynamics of GaAs heterostructure sample. We utilize tnis technique to determine minimum achievable temperature in rare-earth doped fluoride crystal Yb:YLF to be 170K, when excited at 1030nm.

© (2009) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Denis V. Seletskiy ; Michael P. Hasselbeck ; Mansoor Sheik-Bahae and Richard I. Epstein
"Fast differential luminescence thermometry", Proc. SPIE 7228, Laser Refrigeration of Solids II, 72280K (February 09, 2009); doi:10.1117/12.810856; http://dx.doi.org/10.1117/12.810856


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