Paper
10 September 2007 Measurements of linear sizes of relief elements in the nanometer range using an atomic force microscope
P. A. Todua, M. N. Filippov, V. P. Gavrilenko, Yu. A. Novikov, A. V. Rakov
Author Affiliations +
Abstract
The results of the study of image formation in atomic force microscope (AFM) are presented. Effects of the radius and the angular characteristics of the cantilever tip, as well as of the relief of the surface being studied, on the signal shape are discussed. Methods of AFM calibration, including the calibration of all three scales with the use of only one certified size of a test object and the measurement of the cantilever tip radius, are presented. Formulas are obtained that relate the sizes of trapezoidal structures to the sizes of the control intervals chosen in the AFM signals.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
P. A. Todua, M. N. Filippov, V. P. Gavrilenko, Yu. A. Novikov, and A. V. Rakov "Measurements of linear sizes of relief elements in the nanometer range using an atomic force microscope", Proc. SPIE 6648, Instrumentation, Metrology, and Standards for Nanomanufacturing, 66480S (10 September 2007); https://doi.org/10.1117/12.733520
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Cited by 4 scholarly publications.
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KEYWORDS
Atomic force microscopy

Optical spheres

Calibration

Atomic force microscope

Silicon

Solids

Scanning electron microscopy

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