Development of a parallelism tester for visible and infrared compound system

Hongwei Jing; Shibin Wu; Qiang Chen; Boping Lei; Jibin Jiang; Ke Mei

doi:10.1117/12.828281

20 May 2009 Development of a parallelism tester for visible and infrared compound system

Hongwei Jing, Shibin Wu, Qiang Chen, Boping Lei, Jibin Jiang, Ke Mei

Proceedings Volume 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 728303 (2009) https://doi.org/10.1117/12.828281
Event: AOMATT 2008 - 4th International Symposium on Advanced Optical Manufacturing, 2008, Chengdu, Chengdu, China

Abstract

A parallelism tester is developed to measure the parallelism of the visible optical axis and infrared optical axis of visible and infrared compound system.The tester is composed of visible system, infrared system, cassegrain autocollimator, imaging and data processing system and 5D workshop. The visible system generates visible light. The infrared system generates the infrared light. The visible light and infrared light are auto-collimated by the Cassegrain auto-collimator. During measurement the autocollimated light is directed into the optical path of the compound system being tested ,which passes through the compound system being tested and back to the tester. The visible light is used for targetting and infrared light is used for measurement. An 5D workshop is used for adjustment. The imaging and data processing system detects the deviation of infrared light spots and calculate the parallelism of the visible optical axis and infrared optical axis of visible and infrared compound system.The tester can be used to measure the parallelism of visible optical axis and infrared optical axis of visible and infrared compound system. The calibrated accuracy of the tester is 3 arc second.

Citation Download Citation

Hongwei Jing, Shibin Wu, Qiang Chen, Boping Lei, Jibin Jiang, and Ke Mei "Development of a parallelism tester for visible and infrared compound system", Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 728303 (20 May 2009); https://doi.org/10.1117/12.828281

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