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Proceedings Article

Micro assembled Fourier transform spectrometer

[+] Author Affiliations
Yan-mei Kong, Bo Wang

Changchun Institute of Optics, Fine Mechanics and Physics (China) and Graduate School of the Chinese Academy of Sciences (China)

Jing-qiu Liang, Zhong-zhu Liang

Changchun Institute of Optics, Fine Mechanics and Physics (China)

Jun Zhang

Jinan Univ. (China)

Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 728304 (May 20, 2009); doi:10.1117/12.828282
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From Conference Volume 7283

  • 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
  • Yudong Zhang; James C. Wyant; Robert A. Smythe; Hexin Wang
  • Chengdu, China | November 19, 2008

abstract

With the trend of minimization of Fourier transform spectrometer (FTS) which is particularly pronounced in many applications, a model of a micro FTS with no moving parts is proposed and analyzed. During analyzng, the gradients which mainly introduce phase error are accounted. Based on these assumptions and the improved Mertz phase correcting method, the spectrum of signal is simulated with real extended light source. The resolution can be up to 3.43nm@800nm, with high signal-to-noise ratio (SNR) limiting resolving ability 6.8dB. In addition, the fabrication method of components are illuminated and demonstrated, which can not only make it bear some advantages over conventional micro dispersive spectrometers, but also afford some new concepts on the design of spectrometers with improved performance.

© (2009) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Yan-mei Kong ; Jing-qiu Liang ; Zhong-zhu Liang ; Bo Wang and Jun Zhang
"Micro assembled Fourier transform spectrometer", Proc. SPIE 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 728304 (May 20, 2009); doi:10.1117/12.828282; http://dx.doi.org/10.1117/12.828282


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