Paper
15 February 2008 Nanopatterning and selective area epitaxy of GaN on Si substrate
L. S. Wang, S. J. Chua, S. Tripathy, K. Y. Zang, B. Z. Wang, J. H. Teng
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Abstract
Due to lack of suitable lattice matched substrates, III-Nitride materials are usually grown on sapphire, SiC, and silicon. The heteroepitaxy of GaN on these substrates often incorporates a high density of dislocation and point defects due to lattice and thermal mismatch. It is desirable to reduce the defect density in III-Nitrides in order to fabricate longer lifetime and high brightness light emitting diodes, lasers, and high-electron mobility transistors. In this context, nano-scale epitaxy on patterned Si substrates allows lateral growth, which eventually leads to a reduction of defect density and strain in the overgrown GaN films. Large area nano-patterning with dielectric masks would also be useful to fabricate highly-ordered and dense nitride nanostructures by selective area homo- and hetero-epitaxy.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
L. S. Wang, S. J. Chua, S. Tripathy, K. Y. Zang, B. Z. Wang, and J. H. Teng "Nanopatterning and selective area epitaxy of GaN on Si substrate", Proc. SPIE 6894, Gallium Nitride Materials and Devices III, 68940A (15 February 2008); https://doi.org/10.1117/12.762149
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KEYWORDS
Gallium nitride

Silicon

Epitaxy

Nanostructures

Silicon carbide

Metalorganic chemical vapor deposition

Scanning electron microscopy

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