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Proceedings Article

Analysis and representation of BSDF and BRDF measurements

[+] Author Affiliations
Michael E. Thomas, David W. Blodgett, Daniel V. Hahn

Johns Hopkins Univ. (USA)

Proc. SPIE 5192, Optical Diagnostic Methods for Inorganic Materials III, 158 (November 11, 2003); doi:10.1117/12.508560
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From Conference Volume 5192

  • Optical Diagnostic Methods for Inorganic Materials III
  • Leonard M. Hanssen
  • San Diego, California, USA | August 03, 2003

abstract

BSDF and BRDF measurements of randomly rough surfaces are often limited to the plane of incidence. For a surface with no change in optical properties upon rotation in the plane of the sample, this is sufficient to completely represent the BRDF or BSDF of a material at a specific frequency. We apply a simple empirical model that accurately represents the full bi-directional dependence of the scatterance or reflectance based on this limited experimental data set. From these models the total integrated reflectance, total integrated scatterance, and emittance can be obtained. Example measurements of opaque painted flat surfaces, transparent samples, and fibers are presented.

© (2003) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Michael E. Thomas ; David W. Blodgett and Daniel V. Hahn
"Analysis and representation of BSDF and BRDF measurements", Proc. SPIE 5192, Optical Diagnostic Methods for Inorganic Materials III, 158 (November 11, 2003); doi:10.1117/12.508560; http://dx.doi.org/10.1117/12.508560


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