Absolute testing of aspheric surfaces

Stephan Reichelt; Christof Pruss; Hans J. Tiziani

doi:10.1117/12.513364

26 February 2004 Absolute testing of aspheric surfaces

Stephan Reichelt, Christof Pruss, Hans J. Tiziani

Proceedings Volume 5252, Optical Fabrication, Testing, and Metrology; (2004) https://doi.org/10.1117/12.513364
Event: Optical Systems Design, 2003, St. Etienne, France

Abstract

A complete absolute interferometric test of aspheres is presented. The method is based on a specially designed computer-generated hologram (CGH), which reconstructs an aspherical wave as well as auxiliary waves. The auxiliary waves are used for calibration. The aberrations of the auxiliary waves are measured absolutely by means of established absolute testing methods. The errors of the auxiliary waves can be transferred to those of the aspheric wave. Methods for absolute testing of aspheric surfaces using multiplex CGHs are described. Test procedures are explained and equations are derived. For axially symmetric aspheres, experimental results are presented and a comparison with the established N-position rotation test is given.

Citation Download Citation

Stephan Reichelt, Christof Pruss, and Hans J. Tiziani "Absolute testing of aspheric surfaces", Proc. SPIE 5252, Optical Fabrication, Testing, and Metrology, (26 February 2004); https://doi.org/10.1117/12.513364

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