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Proceedings Article

The use of an optically trapped microprobe for scanning details of surface

[+] Author Affiliations
Mojmir Sery

Institute of Scientific Instruments (Czech Republic) and Brno Univ. of Technology (Czech Republic)

Petr Jakl, Jan Jezek, Alexandr Jonas, Pavel Zemanek

Institute of Scientific Instruments (Czech Republic)

Miroslav Liska

Brno Univ. of Technology (Czech Republic)

Proc. SPIE 5259, 13th Polish-Czech-Slovak Conference on Wave and Quantum Aspects of Contemporary Optics, 166 (November 21, 2003); doi:10.1117/12.545118
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From Conference Volume 5259

  • 13th Polish-Czech-Slovak Conference on Wave and Quantum Aspects of Contemporary Optics
  • Krzyzowa, Poland | September 09, 2002

abstract

We present two methods for surface profiles measurement using optically trapped probe in tightly focused laser beam (optical tweezers). The first method is based on a continuous contact of the probe with the surface (contact mode) and the second one employes the alternating contact (tapping mode). The probe deviations are detected by two-photon fluorescence excited by the trapping beam and emitted by the trapped dyed probe.

© (2003) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Mojmir Sery ; Petr Jakl ; Jan Jezek ; Alexandr Jonas ; Pavel Zemanek, et al.
"The use of an optically trapped microprobe for scanning details of surface", Proc. SPIE 5259, 13th Polish-Czech-Slovak Conference on Wave and Quantum Aspects of Contemporary Optics, 166 (November 21, 2003); doi:10.1117/12.545118; http://dx.doi.org/10.1117/12.545118


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