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Proceedings Article

Estimation of the concentration of deep traps in organic photoconductors using two-photon absorption

[+] Author Affiliations
S. V. Novikov, A. R. Tameev, A. V. Vannikov

A.N. Frumkin Institute of Physical Chemistry and Electrochemistry (Russian Federation)

J.-M. Nunzi

Queen's Univ. (Canada)

Proc. SPIE 7993, ICONO 2010: International Conference on Coherent and Nonlinear Optics, 799321 (January 11, 2011); doi:10.1117/12.881032
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From Conference Volume 7993

  • ICONO 2010: International Conference on Coherent and Nonlinear Optics
  • Kazan, Russian Federation | August 23, 2010

abstract

Typically, amorphous organic materials contain high density of traps. Traps hinder charge transport and, hence, affect various working parameters of organic electronic devices. In this paper we suggest a simple but reliable method for the estimation of the concentration of deep traps (traps that keep carriers for a time much longer than the typical transport time of the device). The method is based on the measurement of the dependence of the total charge, collected at the electrode, on the total initial charge, uniformly generated in the transport layer under the action of a light pulse. Advantages and limitations of the method are discussed and an experimental example of the estimation of the density of deep traps in photoconductive organic material poly(2-methoxy-5- (2'-ethylhexyloxy)-1,4-phenylenevinylene (MEH-PPV) is provided.

© (2010) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

S. V. Novikov ; A. R. Tameev ; A. V. Vannikov and J.-M. Nunzi
"Estimation of the concentration of deep traps in organic photoconductors using two-photon absorption", Proc. SPIE 7993, ICONO 2010: International Conference on Coherent and Nonlinear Optics, 799321 (January 11, 2011); doi:10.1117/12.881032; http://dx.doi.org/10.1117/12.881032


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