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Proceedings Article

Near-field mapping of spectroelectrochemical properties of polyaniline

[+] Author Affiliations
R. Barillé

Institut des Sciences et Technologies Moléculaires d'Angers, CNRS (France)

O. L. Gribkova, A. R. Tameev, A. A. Nekrasov, V. F. Ivanov, A. V. Vannikov

A.N. Frumkin Institute of Physical Chemistry and Electrochemistry (Russian Federation)

Proc. SPIE 7994, LAT 2010: International Conference on Lasers, Applications, and Technologies, 79940O (February 07, 2011); doi:10.1117/12.881030
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From Conference Volume 7994

  • LAT 2010: International Conference on Lasers, Applications, and Technologies
  • Vladislav Panchenko; Gérard Mourou; Aleksei M. Zheltikov
  • Kazan, Russian Federation | August 23, 2010

abstract

We combine in this work the measurement of local optical transmission in the near-field with the mapping of the third harmonic generation of semiconducting polymer samples. The use of a linear method with the scanning near-field optical microscope (SNOM) and a nonlinear method with the Third Harmonique Generation (THG) microscope reveal the variation and the nature of the nanomorphology of doped polyaniline thin films.

© (2010) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

R. Barillé ; O. L. Gribkova ; A. R. Tameev ; A. A. Nekrasov ; V. F. Ivanov, et al.
"Near-field mapping of spectroelectrochemical properties of polyaniline", Proc. SPIE 7994, LAT 2010: International Conference on Lasers, Applications, and Technologies, 79940O (February 07, 2011); doi:10.1117/12.881030; http://dx.doi.org/10.1117/12.881030


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