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Proceedings Article

Low-frequency MTF estimation for digital imaging devices using slanted-edge analysis

[+] Author Affiliations
Don Williams, Peter D. Burns

Eastman Kodak Co. (USA)

Proc. SPIE 5294, Image Quality and System Performance, 93 (December 19, 2003); doi:10.1117/12.532405
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From Conference Volume 5294

  • Image Quality and System Performance
  • Yoichi Miyake; D. Rene Rasmussen
  • San Jose, CA | January 18, 2004

abstract

Modulation transfer function (MTF) metrology and interpretation for digital image capture devices has usually concentrated on mid- to high-frequency information, relative to the half-sampling frequency. These regions typically quantify characteristics and operations such as sharpening, limiting resolution, and aliasing. However, a potential wealth of low-frequency, visually significant information is often masked in existing measurement results because of spatial data truncation. For print or document scanners, this influences measurements in the spatial frequency range of 0 to 2.0 cycles/mm, where the effects of veiling flare, micro flare, and integrating cavity effect (ICE) often manifest themselves. Using a form of edge-gradient analysis based on slanted edges, we present a method for measurement of these characteristics. By carefully adapting this well-established technique, these phenomena can be quantified. We also show how, in many cases, these effects can be treated as other spread-function or device-MTF components. The theory and field metrology of several devices using the adapted technique are also presented.

© (2003) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Don Williams and Peter D. Burns
"Low-frequency MTF estimation for digital imaging devices using slanted-edge analysis", Proc. SPIE 5294, Image Quality and System Performance, 93 (December 19, 2003); doi:10.1117/12.532405; http://dx.doi.org/10.1117/12.532405


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