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Proceedings Article

Red electroluminescence of diamond thin films

[+] Author Affiliations
Xiaoping Wang, Yuzhuan Zhu, Xinxin Liu, Lijun Wang, Shi Zhang, Huaihuei Li, Cueiyu Mei, Xiaofei Liu

Univ. of Shanghai for Science and Technology (China)

Proc. SPIE 7995, Seventh International Conference on Thin Film Physics and Applications, 79951K (February 17, 2011); doi:10.1117/12.888163
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From Conference Volume 7995

  • Seventh International Conference on Thin Film Physics and Applications
  • Junhao Chu; Zhanshan Wang
  • Shanghai, China | September 24, 2010

abstract

A diamond/SiO2/ indium-tin oxide (ITO) thin film multilayer structure of electroluminescent devices was reported. Effects of process parameters on morphologies and structures of the thin films were detected and analyzed by scanning electron microscopy, X-ray diffraction (XRD) spectrometer and X-ray photoelectron spectrometer (XPS). Finally a strong monochromatic red light emission was observed from this multilayer structure device, the electroluminescence spectrum at room temperature shows that the only illumination peak locates at 742nm, which is attributed to silicon atoms within the diamond film impurity center.

© (2010) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Xiaoping Wang ; Yuzhuan Zhu ; Xinxin Liu ; Lijun Wang ; Shi Zhang, et al.
"Red electroluminescence of diamond thin films", Proc. SPIE 7995, Seventh International Conference on Thin Film Physics and Applications, 79951K (February 17, 2011); doi:10.1117/12.888163; http://dx.doi.org/10.1117/12.888163


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