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Proceedings Article

Effects of texture on the properties of polycrystalline HgI2 films

[+] Author Affiliations
Weimin Shi, Linjun Wang, Haokun Hu, Yiben Xia

Shanghai Univ. (China)

Qingfeng Su

Shanghai Univ. (China) and Shanghai New Energy S&T Co. Ltd. (China)

Dongmin Li

Shanghai Westingarea M&E System Co. Ltd. (China)

Proc. SPIE 7995, Seventh International Conference on Thin Film Physics and Applications, 79951L (February 17, 2011); doi:10.1117/12.888212
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From Conference Volume 7995

  • Seventh International Conference on Thin Film Physics and Applications
  • Junhao Chu; Zhanshan Wang
  • Shanghai, China | September 24, 2010

abstract

Due to different oriented polycrystalline HgI2 films show different properties. In this paper the properties of different oriented HgI2 films have been investigated by scanning electron microscopy, X-ray diffraction and current-voltage measurements. The measured results indicate HgI2 films are of high quality and the properties of the (001)-oriented HgI2 film are better than those of the free oriented ones. The dark current of the (001)-oriented HgI2 film is 0.5 nA with an applied bias voltage of 40 V. The current of (001)-oriented HgI2 film keeps unchanged during measurement.

© (2010) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Weimin Shi ; Qingfeng Su ; Dongmin Li ; Linjun Wang ; Haokun Hu, et al.
"Effects of texture on the properties of polycrystalline HgI2 films", Proc. SPIE 7995, Seventh International Conference on Thin Film Physics and Applications, 79951L (February 17, 2011); doi:10.1117/12.888212; http://dx.doi.org/10.1117/12.888212


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