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Proceedings Article

Near-field microwave phase imaging by a spintronic sensor

[+] Author Affiliations
XiaoFeng Zhu

Shanghai Institute of Technical Physics (China) and Univ. of Manitoba (Canada)

M. Harder, A. Wirthmann, Y. S. Gui, C.-M. Hu

Univ. of Manitoba (Canada)

Bo Zhang, W. Lu

Shanghai Institute of Technical Physics (China)

Proc. SPIE 7995, Seventh International Conference on Thin Film Physics and Applications, 79951X (February 17, 2011); doi:10.1117/12.888266
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From Conference Volume 7995

  • Seventh International Conference on Thin Film Physics and Applications
  • Junhao Chu; Zhanshan Wang
  • Shanghai, China | September 24, 2010

abstract

We report a novel technique for microwave imaging utilizing a nonlinear coupling between the microwave fields in a ferromagnetic material, in which the relative phase of the coupled microwave fields plays an important role in the resultant homodyne dc voltage. A technical breakthrough has been achieved to effectively control such a relative phase using a spintronic Michelson interferometry. This enables a phase- and amplitude-resolved near-field dielectric image using a spintronic sensor. The contrast of microwave imaging for an object with subwavelength features strongly depends on the local dielectric constant of materials, and agrees well with simulation results by COMSOL.

© (2010) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

XiaoFeng Zhu ; M. Harder ; A. Wirthmann ; Bo Zhang ; W. Lu, et al.
"Near-field microwave phase imaging by a spintronic sensor", Proc. SPIE 7995, Seventh International Conference on Thin Film Physics and Applications, 79951X (February 17, 2011); doi:10.1117/12.888266; http://dx.doi.org/10.1117/12.888266


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