Paper
18 February 2011 Erbium silicide nanostructures self-assembled on Si(001) by cyclic growth
Tao Ding, Junqiang Song, Juan Li, Qun Cai
Author Affiliations +
Proceedings Volume 7995, Seventh International Conference on Thin Film Physics and Applications; 79952A (2011) https://doi.org/10.1117/12.888533
Event: Seventh International Conference on Thin Film Physics and Applications, 2010, Shanghai, China
Abstract
Erbium silicide nanostructures were self assembled on the Si(001) substrates by novel multiple deposition and annealing steps. In-situ scanning probe microscopy (SPM) and ex-situ scanning electron microscopy (SEM) were used to characterize the morphology of the nanostructures. Compared with traditional growth method, it was found that ErSi2 nanostructures fabricated by cyclic growth could keep stable morphology avoiding the shape instability. Besides, both the size and distribution density could be well controlled, which have significance in the application of nanostructures.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tao Ding, Junqiang Song, Juan Li, and Qun Cai "Erbium silicide nanostructures self-assembled on Si(001) by cyclic growth", Proc. SPIE 7995, Seventh International Conference on Thin Film Physics and Applications, 79952A (18 February 2011); https://doi.org/10.1117/12.888533
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KEYWORDS
Nanostructures

Erbium

Annealing

Scanning electron microscopy

Nanowires

Scanning probe microscopy

Silicon

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