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Proceedings Article

Growth orientation and surface morphology of CeO2 films for high-Jc YBCO films on biaxially textured Ni tape by PLD

[+] Author Affiliations
Huaran Liu, Linfei Liu, Xiaokun Song, Dan Hong, Ying Wang, Yijie Li

Shanghai Jiao Tong Univ. (China)

Proc. SPIE 7995, Seventh International Conference on Thin Film Physics and Applications, 799521 (February 17, 2011); doi:10.1117/12.888280
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From Conference Volume 7995

  • Seventh International Conference on Thin Film Physics and Applications
  • Junhao Chu; Zhanshan Wang
  • Shanghai, China | September 24, 2010

abstract

Epitaxial cerium oxide buffer layers were deposited on biaxially-textured (001) Ni tape using reel-to-reel pulsed laser deposition in a vacuum chamber. Relationship between microstructure and deposition parameters was systematically studied by X-ray diffraction (XRD), scanning electron microscopy (SEM), and atomic force microscopy (AFM). We found the optimal deposition parameters for CeO2 buffer layer which were quite suitable for preparing high-Jc YBCO films. The relationship between CeO2 layer thickness and crack formation has also been discussed.

© (2010) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Huaran Liu ; Linfei Liu ; Xiaokun Song ; Dan Hong ; Ying Wang, et al.
"Growth orientation and surface morphology of CeO2 films for high-Jc YBCO films on biaxially textured Ni tape by PLD", Proc. SPIE 7995, Seventh International Conference on Thin Film Physics and Applications, 799521 (February 17, 2011); doi:10.1117/12.888280; http://dx.doi.org/10.1117/12.888280


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