Growth orientation and surface morphology of CeO2 films for high-Jc YBCO films on biaxially textured Ni tape by PLD

Huaran Liu; Linfei Liu; Xiaokun Song; Dan Hong; Ying Wang; Yijie Li

doi:10.1117/12.888280

18 February 2011 Growth orientation and surface morphology of CeO₂ films for high-Jc YBCO films on biaxially textured Ni tape by PLD

Huaran Liu, Linfei Liu, Xiaokun Song, Dan Hong, Ying Wang, Yijie Li

Author Affiliations +

Proceedings Volume 7995, Seventh International Conference on Thin Film Physics and Applications; 799521 (2011) https://doi.org/10.1117/12.888280
Event: Seventh International Conference on Thin Film Physics and Applications, 2010, Shanghai, China

Abstract

Epitaxial cerium oxide buffer layers were deposited on biaxially-textured (001) Ni tape using reel-to-reel pulsed laser deposition in a vacuum chamber. Relationship between microstructure and deposition parameters was systematically studied by X-ray diffraction (XRD), scanning electron microscopy (SEM), and atomic force microscopy (AFM). We found the optimal deposition parameters for CeO₂ buffer layer which were quite suitable for preparing high-Jc YBCO films. The relationship between CeO₂ layer thickness and crack formation has also been discussed.

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Huaran Liu, Linfei Liu, Xiaokun Song, Dan Hong, Ying Wang, and Yijie Li "Growth orientation and surface morphology of CeO₂ films for high-Jc YBCO films on biaxially textured Ni tape by PLD", Proc. SPIE 7995, Seventh International Conference on Thin Film Physics and Applications, 799521 (18 February 2011); https://doi.org/10.1117/12.888280

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