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Proceedings Article

Ultra-fast wavefront analyser for high volume production of camera modules lenses

[+] Author Affiliations
M. Cherrier

Trioptics France (France)

I. Erichsen, A. Ruprecht, S. Krey

Trioptics GmbH (Germany)

Proc. SPIE 6995, Optical Micro- and Nanometrology in Microsystems Technology II, 699512 (April 25, 2008); doi:10.1117/12.781433
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From Conference Volume 6995

  • Optical Micro- and Nanometrology in Microsystems Technology II
  • Christophe Gorecki; Anand K. Asundi; Wolfgang Osten
  • Strasbourg, France | April 07, 2008

abstract

Aspheric lenses are of increasing importance in compact imaging systems. New developments in production technologies have led to the so called wafer level production with several thousands of lenses on a single wafer. This high volume production demands fast testing equipment which allows for the characterization of complete imaging systems as well as of all of its single components. In most of the cases conventional methods cannot be used to measure single lenses or objectives in earlier production states. Although e.g. the measurement of the modulation transfer function is a well established method for fast and accurate quality inspection of entire objectives it has its limitation for single lenses. Due to its very large dynamic range the Shack-Hartmann sensor is able to measure a very broad range of spherical and aspherical lenses as well as partially or fully assembled objectives. With the combination of a fast high accuracy wavefront sensor and special positioning algorithms which allow for high throughput in mass production a new flexible instrument has been developed.

© (2008) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

M. Cherrier ; I. Erichsen ; A. Ruprecht and S. Krey
"Ultra-fast wavefront analyser for high volume production of camera modules lenses", Proc. SPIE 6995, Optical Micro- and Nanometrology in Microsystems Technology II, 699512 (April 25, 2008); doi:10.1117/12.781433; http://dx.doi.org/10.1117/12.781433


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