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Proceedings Article

Micro-displacement measurement based on electronic speckle

[+] Author Affiliations
Xiaoping Lang, Xiaoying Li

Beijing Information Science & Technology Univ. (China)

Proc. SPIE 7997, Fourth International Seminar on Modern Cutting and Measurement Engineering, 79972R (May 26, 2011); doi:10.1117/12.891859
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From Conference Volume 7997

  • Fourth International Seminar on Modern Cutting and Measurement Engineering
  • Jiezhi Xin; Lianqing Zhu; Zhongyu Wang
  • Beijing, China | December 10, 2010

abstract

The method to measure micro-displacement based on Electronic Speckle is theoretically analyzed. An interferometer system is set up for measuring in-plane displacement of the measured surface, where the charge-coupled device (CCD) is used for image acquisition. It is well known that there are strong grain-shape random noises in the speckle patterns, which make heavy influence on the visibility and resolution of speckle fringes. Hence the technique of image processing is important to improve the contrast of the speckle fringes. For this reason, good experimental conditions are required to capture better speckle patterns; then image filtering and Fourier transformation are used to process the patterns. It is proved that the method in this paper can effectively improve the measurement results.

© (2010) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Xiaoping Lang and Xiaoying Li
"Micro-displacement measurement based on electronic speckle", Proc. SPIE 7997, Fourth International Seminar on Modern Cutting and Measurement Engineering, 79972R (May 26, 2011); doi:10.1117/12.891859; http://dx.doi.org/10.1117/12.891859


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