Industrial-camera-based high-power YAG beam profiler

Lawrence I. Green

doi:10.1117/12.524026

1 June 2004 Industrial-camera-based high-power YAG beam profiler

Lawrence I. Green

Proceedings Volume 5333, Laser Resonators and Beam Control VII; (2004) https://doi.org/10.1117/12.524026
Event: Lasers and Applications in Science and Engineering, 2004, San Jose, Ca, United States

Abstract

The increased use of high power Semiconductor lasers for industrial applications has created a demand for accurate, detailed beam profiling devices. Current technology, however, limits the use of conventional beam profiling instruments to about 1.5 kW. We will discuss a novel method of profiling high power YAG (1064 nm) industrial lasers up to 4kW in average power and 30 mm in raw beam diameter, using a camera-based, computer operated beam-profiling device. The new instrument is portable and employs conventional optics to attenuate and reduce the raw beam, and is designed to be used in an industrial environment.

Citation Download Citation

Lawrence I. Green "Industrial-camera-based high-power YAG beam profiler", Proc. SPIE 5333, Laser Resonators and Beam Control VII, (1 June 2004); https://doi.org/10.1117/12.524026

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