Full Content is available to subscribers

Subscribe/Learn More  >
Proceedings Article

Creation of an artifact database and experimental measurement of their detectability thresholds in noises of different spectra, in the context of quality control of an x-ray imager

[+] Author Affiliations
J.M. Vignolle, L. Debize, I. Bensaid, R. Forich, C. Berthaud, C. Marmajou, B. Candiard

Trixell (France)

Proc. SPIE 8000, Tenth International Conference on Quality Control by Artificial Vision, 80000B (July 12, 2011); doi:10.1117/12.888838
Text Size: A A A
From Conference Volume 8000

  • Tenth International Conference on Quality Control by Artificial Vision
  • Jean-Charles Pinoli; Johan Debayle; Yann Gavet; Frédéric Gruy; Claude Lambert
  • Saint-Etienne, France | June 28, 2011

abstract

In order to assess the quality of an X-ray imager it is necessary to measure the visibility of any artifact that might be present in the image. Several methods have been proposed in the literature to calculate this visibility. To predict the performance of these methods in the context of quality control of X-ray imagers, a base of 10 artifacts as different as possible in shape and aspect have been created (a pixel, a line, a step, various spots and noises). The amplitude for which each artifact has a probability of 50% to be detected has been determined. To do so, the artifacts have been observed merged with three noises of different spectra ("white noise", "high-frequency" noise and "low-frequency" noise). To determine the 50% detection probability amplitudes, a variant of the 2 Alternative Forced Choice procedure has been used. It has been checked that the measurement exploitation method is unbiased and its precision is sufficient. The dispersion of results between testers, around 15% in average, is also satisfactory. These results are a solid and objective basis to check the relevance and limits of visibility measurement methods described in literature, applied to the domain of quality control of X-ray imagers.

© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation

J.M. Vignolle ; L. Debize ; I. Bensaid ; R. Forich ; C. Berthaud, et al.
"Creation of an artifact database and experimental measurement of their detectability thresholds in noises of different spectra, in the context of quality control of an x-ray imager", Proc. SPIE 8000, Tenth International Conference on Quality Control by Artificial Vision, 80000B (July 12, 2011); doi:10.1117/12.888838; http://dx.doi.org/10.1117/12.888838


Access This Proceeding
Sign in or Create a personal account to Buy this proceeding ($15 for members, $18 for non-members).

Figures

Tables

NOTE:
Citing articles are presented as examples only. In non-demo SCM6 implementation, integration with CrossRef’s "Cited By" API will populate this tab (http://www.crossref.org/citedby.html).

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging & repositioning the boxes below.

Related Book Chapters

Topic Collections

Advertisement
  • Don't have an account?
  • Subscribe to the SPIE Digital Library
  • Create a FREE account to sign up for Digital Library content alerts and gain access to institutional subscriptions remotely.
Access This Proceeding
Sign in or Create a personal account to Buy this proceeding ($15 for members, $18 for non-members).
Access This Proceeding
Sign in or Create a personal account to Buy this article ($15 for members, $18 for non-members).
Access This Chapter

Access to SPIE eBooks is limited to subscribing institutions and is not available as part of a personal subscription. Print or electronic versions of individual SPIE books may be purchased via SPIE.org.