Paper
25 May 2004 Noise in imaging systems: fixed pattern noise, electronic, and interference noise
Jose Manuel Lopez-Alonso, Ruben Gonzalez-Moreno, Javier Alda
Author Affiliations +
Proceedings Volume 5468, Fluctuations and Noise in Photonics and Quantum Optics II; (2004) https://doi.org/10.1117/12.547092
Event: Second International Symposium on Fluctuations and Noise, 2004, Maspalomas, Gran Canaria Island, Spain
Abstract
Imaging digital systems are widely used nowadays. CCD and CMOS sensors are embedded in a lot of metrologic devices for metrology in a lot of devices. One of these applications is the characterization of laser beams. For these kinds of applications, it is necessary to use cameras with high dynamic range. Some algorithms have been proposed in the past for this purpose. But, normally they enhance not only the dynamic range but the noise sensor too. In this paper we have applied an automatic algorithm to classify the different noise processes appearing in a CCD matrix. The method is based on a principal component expansion of the covariance matrix of some frames taken with the camera. It is possible to classify not only non-uniformity noise of the detector matrix, but also those contributions due to electronics and electronic interference and vibrations. Some of these noise processes represent only a very low amount of the total noise. A method to filter these noises is also presented.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jose Manuel Lopez-Alonso, Ruben Gonzalez-Moreno, and Javier Alda "Noise in imaging systems: fixed pattern noise, electronic, and interference noise", Proc. SPIE 5468, Fluctuations and Noise in Photonics and Quantum Optics II, (25 May 2004); https://doi.org/10.1117/12.547092
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KEYWORDS
Charge-coupled devices

Imaging systems

Cameras

Sensors

CCD image sensors

CCD cameras

Metrology

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