LED photometric calibrations at the National Institute of Standards and Technology and future measurement needs of LEDs

C. Cameron Miller; Yuqin Zong; Yoshihiro Ohno

doi:10.1117/12.566635

20 October 2004 LED photometric calibrations at the National Institute of Standards and Technology and future measurement needs of LEDs

C. Cameron Miller, Yuqin Zong, Yoshihiro Ohno

Author Affiliations +

Proceedings Volume 5530, Fourth International Conference on Solid State Lighting; (2004) https://doi.org/10.1117/12.566635
Event: Optical Science and Technology, the SPIE 49th Annual Meeting, 2004, Denver, Colorado, United States

Abstract

Various new light-emitting diodes (LEDs) including white LEDs are being actively developed for solid-state lighting and many other applications, and there are great needs for accurate measurement of various optical quantities of LEDs. Traditional lamp standards do not suffice for specific measurement needs for LEDs. The National Institute of Standards and Technology (NIST) has recently established calibration services for photometric quantities (luminous intensity and luminous flux) of LEDs, but the measurement needs are expanding. This paper covers the current capabilities and services NIST provides for calibration of LEDs and discusses the future needs for optical metrology of LEDs. Work is just completed at NIST to provide official color calibrations of LEDs (chromaticity coordinates, peak wavelength, correlated color temperature, etc.). Another urgent need addressed is radiometric calibration of LEDs, particularly the total radiant flux (watt) of ultraviolet (UV) LEDs used to excite phosphors for white LEDs. Also, as spectroradiometers coupled with an integrating sphere are increasingly used total spectral radiant flux standards from NIST are in urgent demand. Presented is the scope of NIST plans to realize these new radiometric calibration capabilities for LEDs in the near future.

Citation Download Citation

C. Cameron Miller, Yuqin Zong, and Yoshihiro Ohno "LED photometric calibrations at the National Institute of Standards and Technology and future measurement needs of LEDs", Proc. SPIE 5530, Fourth International Conference on Solid State Lighting, (20 October 2004); https://doi.org/10.1117/12.566635

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