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Proceedings Article

Phase-shifting multiwavelength dynamic interferometer

[+] Author Affiliations
Michael B. North-Morris, James E. Millerd, Neal J. Brock, John B. Hayes

4D Technology Corp. (USA)

Proc. SPIE 5531, Interferometry XII: Techniques and Analysis, 64 (August 2, 2004); doi:10.1117/12.560829
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From Conference Volume 5531

  • Interferometry XII: Techniques and Analysis
  • Katherine Creath; Joanna Schmit
  • Denver, CO | August 02, 2004

abstract

The benefits of using two-wavelength measurements to extend the dynamic range of an interferometric measurement are well known. We present a new multi-wavelength interferometer that uses two successive single frame measurements obtained rapidly in time to significantly reduce sensitivity to vibration. At each wavelength, four phase-shifted interferograms are captured in a single image. The total acquisition time for both wavelengths is 100 microseconds, over three orders of magnitude shorter than conventional interferometers. Consequently, the measurements do not suffer from the fringe contrast reduction and measurement errors that plague temporal phase-shifting interferometers in the presence of vibration. In this paper we will discuss the basic operating principle of the interferometer, analyze its performance and show some interesting measurements.

© (2004) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Michael B. North-Morris ; James E. Millerd ; Neal J. Brock and John B. Hayes
"Phase-shifting multiwavelength dynamic interferometer", Proc. SPIE 5531, Interferometry XII: Techniques and Analysis, 64 (August 2, 2004); doi:10.1117/12.560829; http://dx.doi.org/10.1117/12.560829


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