Calculation of x-ray refraction from near-edge absorption data only

Chris J. Jacobsen; Steve Yuxin Wang; Wenbing Yun; Sean Frigo

doi:10.1117/12.560160

14 October 2004 Calculation of x-ray refraction from near-edge absorption data only

Chris J. Jacobsen, Steve Yuxin Wang, Wenbing Yun, Sean Frigo

Proceedings Volume 5538, Optical Constants of Materials for UV to X-Ray Wavelengths; (2004) https://doi.org/10.1117/12.560160
Event: Optical Science and Technology, the SPIE 49th Annual Meeting, 2004, Denver, Colorado, United States

Abstract

Near-edge x-ray absorption resonances provide information on molecular orbital structure; these resonances can be exploited in x-ray spectromicroscopy to give sub-50-nanometer resolution images with chemical state sensitivity. At the same time, radiation damage sets a limit to the resolution that can be obtained in absorption mode. Phase contrast imaging may provide another means of chemical state imaging with lower radiation dose. We describe here the use of experimentally measured near-edge absorption data to estimate near-edge phase resonances. This is accomplished by splicing the near-edge data into reference data and carrying out a numerical integration of the Kramers-Kronig relation.

Citation Download Citation

Chris J. Jacobsen, Steve Yuxin Wang, Wenbing Yun, and Sean Frigo "Calculation of x-ray refraction from near-edge absorption data only", Proc. SPIE 5538, Optical Constants of Materials for UV to X-Ray Wavelengths, (14 October 2004); https://doi.org/10.1117/12.560160

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