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Proceedings Article

Tests on micromirror arrays for adaptive optics

[+] Author Affiliations
Jan Liesener

Institut fur Technische Optik (Germany)

Werner J. Hupfer

EADS Astrium GmbH (Germany)

Andreas Gehner

Fraunhofer-Institut fur Photonische Mikrosysteme (Germany)

Kotska Wallace

European Space Agency (Netherlands)

Proc. SPIE 5553, Advanced Wavefront Control: Methods, Devices, and Applications II, 319 (October 12, 2004); doi:10.1117/12.558679
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From Conference Volume 5553

  • Advanced Wavefront Control: Methods, Devices, and Applications II
  • John D. Gonglewski; Mark T. Gruneisen; Michael K. Giles
  • Denver, CO | August 02, 2004

abstract

Micro Mirror Arrays (MMAs) offer the potential of a high spatial and temporal resolution technology for wavefront control applications. In this paper a new Micro-Electro-Mechanical-System (MEMS) based MMA type is investigated. As opposed to most other MMA technologies which involve flip mirrors with only two possible orientations, this system can support two different mirror designs, piston-type mirrors for a continuous phase adjustment and tilt mirrors for light discarding purposes. The MMA's wavefront correction capabilities are being investigated in a breadboard which simulates continuous distortions and step errors, such as those that could be expected from lightweight primary mirrors of space telescopes or segmented mirrors, respectively. The wavefront is corrected by the MMA, then coupled into a monomode fiber. Four different correction methods have been tested, two stochastic approaches, a closed-loop Shack-Hartmann approach and an interferometric approach. Comparison of coupling efficiency is made between these approaches and against theoretical calculations.

© (2004) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Jan Liesener ; Werner J. Hupfer ; Andreas Gehner and Kotska Wallace
"Tests on micromirror arrays for adaptive optics", Proc. SPIE 5553, Advanced Wavefront Control: Methods, Devices, and Applications II, 319 (October 12, 2004); doi:10.1117/12.558679; http://dx.doi.org/10.1117/12.558679


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