Paper
21 October 2004 Inspection of fabrics with fluffy appearance by NIR image analysis
Author Affiliations +
Proceedings Volume 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications; (2004) https://doi.org/10.1117/12.590651
Event: 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, 2004, Porlamar, Venezuela
Abstract
Some fabrics, either woven or knitted, show a fibrous, fluffy appearance that hides their thread interlacing structure. In such a case tasks related with inspection of the fabric structure, identification, classification and fault detection are difficult to carry out. A remarkable improvement can be obtained when the fabric image to evaluate is captured under near infrared (NIR) illumination. NIR illumination penetrates in the material more than visible illumination and the reflected image contains more information about its structure. Although humans are not sensitive in this region, we can observe a NIR image of a fabric by exploiting the residual sensitivity of a conventional monochrome camera that reaches up to 1000 nm. The light source used is an array of NIR LEDs emitting in a band to which the camera is still sensitive. This inexpensive image acquisition system is completed with a monochrome TV monitor to display the NIR image and a computer for image analysis. Some results obtained by applying Fourier analysis to the fabric image obtained under either visible or NIR illumination are provided and discussed.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Maria Sagrario Millan and Jaume Escofet "Inspection of fabrics with fluffy appearance by NIR image analysis", Proc. SPIE 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, (21 October 2004); https://doi.org/10.1117/12.590651
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KEYWORDS
Near infrared

Fourier transforms

Inspection

Cameras

Image analysis

Light emitting diodes

Image enhancement

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