Paper
20 January 2005 Temperature and water vapor retrieval from IMG/ADEOS spectrum data
Author Affiliations +
Proceedings Volume 5655, Multispectral and Hyperspectral Remote Sensing Instruments and Applications II; (2005) https://doi.org/10.1117/12.578629
Event: Fourth International Asia-Pacific Environmental Remote Sensing Symposium 2004: Remote Sensing of the Atmosphere, Ocean, Environment, and Space, 2004, Honolulu, Hawai'i, United States
Abstract
This study presents an analysis of atmospheric temperature and water vapor using interferometric monitor for greenhouse gases (IMG) spectrum data and its retrieval procedure. The IMG is a high-resolution infrared sensor of the Fourier transform spectrometer (FTS) type that was launched aboard the Advanced Earth Observing Satellite (ADEOS) satellite in August 1996. Upwelling infrared radiation from the Earth was measured to examine the effects of greenhouse gases in the troposphere until June 1997. In the procedure to retrieve trace gas profiles from such satellite-based FTS data, accurate information on temperature, water vapor and surface properties is essential for precise retrieval. The instrument line shape (ILS) function, which generally depends on many factors of its sensor system, must also be determined accurately. In order to estimate the optimal ILS function, the "effective optical path difference (OPD)", which is assumed in retrieval analyses, is tuned to obtain the most optimal retrieved results in comparison with the sonde data. This method was applied to IMG spectrum data.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yoshifumi Ota and Ryoichi Imasu "Temperature and water vapor retrieval from IMG/ADEOS spectrum data", Proc. SPIE 5655, Multispectral and Hyperspectral Remote Sensing Instruments and Applications II, (20 January 2005); https://doi.org/10.1117/12.578629
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KEYWORDS
Fourier transforms

Absorption

Satellites

Troposphere

Gases

Spectral resolution

Temperature metrology

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