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Proceedings Article

Scanning microscopy with extended depth of focus

[+] Author Affiliations
Rimas Juskaitis, Edward J. Botcherby, Tony Wilson

Univ. of Oxford (United Kingdom)

Proc. SPIE 5701, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XII, 85 (March 31, 2005); doi:10.1117/12.585195
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From Conference Volume 5701

  • Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XII
  • Jose-Angel Conchello; Carol J. Cogswell; Tony Wilson
  • San Jose, CA | January 22, 2005

abstract

We demonstrate a simple and light-efficient way of generating non-diffracting Bessel beams for use in confocal microscopy. A number of imaging modalities using such beams is discussed. Preliminary experimental results including brightfield, fluorescence and two-photon images are presented.

© (2005) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
Citation

Rimas Juskaitis ; Edward J. Botcherby and Tony Wilson
"Scanning microscopy with extended depth of focus", Proc. SPIE 5701, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XII, 85 (March 31, 2005); doi:10.1117/12.585195; http://dx.doi.org/10.1117/12.585195


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